Three models are available depending on the current
and voltage specifications.
LX4750 3A-100V
LX4740 1A-30V
LX4730 0.35A-30V
For document requests and inquiries, please contact us using the email form below or by phone.
Optical measurement a wide range of measurements from ultraviolet tofar infrared is possible.
Achieved the fastest test time ※1 in the industry.
Contact probe monitoring※2 can be performed even during measurement.
※1 According to our research
※2 Cannot be determined for single contact
We perform classification measurement with a very fast test time.
Demonstrates excellent performance in automated test systems on LED production lines.
Even characteristic tests, which are time-consuming in normal tests, are measured at high speed.
TOTAL TEST TIME is an actual measurement value
Measurement content example
Each item setting TEST TIME 1ms ~ 3ms
IR (leak measurement) -5V applied TEST TIME 2ms or less
VF (small current) + 0.1uA applied TEST TIME 2ms or less
We also have optical measurements
such as unique measurement of LD
device, FFP measurement, NFP
measurement, and Pulse measurement.
We are involved in IR(infrared
spectroscopy) inspection systems,
including appearance.
As a pioneer of embossed carrier tape, we provide the industry's highest level products with quality, management system, in-house mold manufacturing technology, original molding method, and in-house molding machine cultivated over a long history.
With the manufacture of carrier tape "Taping machine" that wraps electronic parts in embossed tape, We also develop, manufacture, and sell "Sorting machines" that sort semiconductors by rank.
For document requests and inquiries, please contact us using the email form below or by phone.
+81-428-31-8211