LX4750

We also have optical measurements such as FFP
measurement, NFP measurement, and
Pulse measurement, including unique measurement of
LD devices.
【Applicable device】LD(Laser Diodes) / VCSEL

Features of LX72 series

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Even characteristic tests, which are time-consuming in normal tests, are measured at high speed.
TOTAL TEST TIME is an actual measurement value
Measurement content example
Each item setting TEST TIME 1ms ~ 3ms
IR (leak measurement) -5V applied TEST TIME 2ms or less
VF (small current) + 0.1uA applied TEST TIME 2ms or less



Pulse Measurement   current 350mA / width 50usec

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Beam profile
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Tester &  Image inspection equipment lineup

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LED tester
LX47 series

In addition to the unique measurement
of LED devices, optical measurement in
the infrared, visible, and ultraviolet
regions is possible.

リール供給テーピング装置NCT-8000シリーズ

Image inspection equipment

We are involved in IR
(infrared spectroscopy) inspection
systems, including appearance. 

CONTACT

For document requests and inquiries, please contact us using the email form below or by phone.

Click here for inquiries by phone

+81-428-31-8211

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